• DocumentCode
    403798
  • Title

    Coverage-directed management and optimization of random functional verification

  • Author

    Hekmatpour, Amir ; Coulter, James

  • Author_Institution
    EBM Microelectronics
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30 2003-Oct. 2 2003
  • Firstpage
    148
  • Lastpage
    155
  • Keywords
    Convergence; Costs; Distributed power generation; Inference mechanisms; Logic testing; Microelectronics; Power generation; Power system management; Power system modeling; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • Conference_Location
    Charlotte, NC, USA
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1270835
  • Filename
    1270835
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=403798