Title :
Coverage-directed management and optimization of random functional verification
Author :
Hekmatpour, Amir ; Coulter, James
Author_Institution :
EBM Microelectronics
fDate :
Sept. 30 2003-Oct. 2 2003
Keywords :
Convergence; Costs; Distributed power generation; Inference mechanisms; Logic testing; Microelectronics; Power generation; Power system management; Power system modeling; System testing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Conference_Location :
Charlotte, NC, USA
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270835
