• DocumentCode
    403800
  • Title

    Application and demonstration of a digital test core: optoelectronic test bed and wafer-level prober

  • Author

    Davis, J.S. ; Keezer, D.C. ; Liboiron-Ladouceur, O. ; Bergman, K.

  • Author_Institution
    Georgia Institute of Technology
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    166
  • Lastpage
    174
  • Keywords
    Automatic testing; Built-in self-test; Circuit testing; Costs; Electronic equipment testing; Logic devices; Logic testing; Programmable logic arrays; System testing; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1270837
  • Filename
    1270837
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=403800