Title :
Application and demonstration of a digital test core: optoelectronic test bed and wafer-level prober
Author :
Davis, J.S. ; Keezer, D.C. ; Liboiron-Ladouceur, O. ; Bergman, K.
Author_Institution :
Georgia Institute of Technology
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic testing; Built-in self-test; Circuit testing; Costs; Electronic equipment testing; Logic devices; Logic testing; Programmable logic arrays; System testing; Test equipment;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270837
