Title :
RIC/DICMOS - multichannel CMOS formatter
Author :
Syed, Ahmed Rashid
Author_Institution :
NPTest
fDate :
Sept. 30 2003-Oct. 2 2003
Keywords :
Accuracy; CMOS integrated circuits; CMOS process; Circuit testing; Cost function; Design engineering; Hardware; Pins; System testing; Timing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Conference_Location :
Charlotte, NC, USA
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270838
