Title :
Data flow within an open architecture tester
Author :
Gavardoni, Maurizio
Author_Institution :
NPTest
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Costs; Delay; Design optimization; Electronic equipment testing; Environmental management; Instruments; Memory management; Protocols; Resource management; Topology;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270839
