Title :
A new methodology for adc test flow optimization
Author :
Bernard, S. ; Comte, M. ; Azais, F. ; Bertrand, Y. ; Renovell, M.
Author_Institution :
LIRMM, University of Montpellier
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Analog-digital conversion; Circuit testing; Costs; Integrated circuit testing; Linearity; Optimization methods; Performance evaluation; Production; Spectral analysis; System testing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270841
