Title :
Method of reducing contactor effect when testing high-precision adcs
Author :
Maugard, Gwenolé ; Wegener, Carsten ; O´Dwye, T. ; Kennedy, Michael Peter
Author_Institution :
Analog Devices, Raheen Industrial Estate
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Contacts; Degradation; Linearity; Microelectronics; Noise measurement; Noise reduction; Packaging; Production; Testing; Working environment noise;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270842
