DocumentCode

403807

Title

Testing high frequency adcs and dacs with a low frequency analog bus

Author

Sunter, Stephen K.

Author_Institution

LogicVision, Inc.

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

228

Lastpage

235

Keywords

Bandwidth; Built-in self-test; Circuit testing; Costs; Delta-sigma modulation; Frequency conversion; Integrated circuit testing; Linearity; Sampling methods; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1270844

Filename

1270844