DocumentCode

403810

Title

Fault localization using time resolved photon emission and stil waveforms

Author

Nataraj, Nisha ; Lundquist, T.

Author_Institution

NPTest

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

254

Lastpage

263

Keywords

Circuit faults; Circuit simulation; Circuit testing; Fault diagnosis; Logic; Photoelectricity; Photonic integrated circuits; Time measurement; Timing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1270847

Filename

1270847