Title :
Fault localization using time resolved photon emission and stil waveforms
Author :
Nataraj, Nisha ; Lundquist, T.
Author_Institution :
NPTest
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Circuit faults; Circuit simulation; Circuit testing; Fault diagnosis; Logic; Photoelectricity; Photonic integrated circuits; Time measurement; Timing; Voltage;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270847
