Title :
Fault collapsing via functional dominance
Author :
Agrawal, Vishwani D. ; Prasad, A.V.S.S. ; Atre, Madhusudan V.
Author_Institution :
Agere Systems
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Adders; Benchmark testing; Circuit analysis computing; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Fault diagnosis; Functional analysis; System testing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270849
