Title :
Efficient sequential atpg based on partitioned finite-state-machine traversal
Author :
Wu, Qingwei ; Hsiao, Michael S.
Author_Institution :
Virginia Tech
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic test pattern generation; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Fault detection; Flip-flops; Logic testing; Sequential circuits; State-space methods;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270850
