DocumentCode
403812
Title
Efficient sequential atpg based on partitioned finite-state-machine traversal
Author
Wu, Qingwei ; Hsiao, Michael S.
Author_Institution
Virginia Tech
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
281
Lastpage
289
Keywords
Automatic test pattern generation; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Fault detection; Flip-flops; Logic testing; Sequential circuits; State-space methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1270850
Filename
1270850
Link To Document