Title :
Efficient sequential atpg for functional rtl circuits
Author :
Zhang, Liang ; Ghosh, Indradeep ; Hsiao, Michael
Author_Institution :
Fujitsu Labs. of America Inc.
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Algebra; Automatic test pattern generation; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Counting circuits; Design for testability; Logic testing; Sequential analysis;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270851
