DocumentCode
403813
Title
Efficient sequential atpg for functional rtl circuits
Author
Zhang, Liang ; Ghosh, Indradeep ; Hsiao, Michael
Author_Institution
Fujitsu Labs. of America Inc.
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
290
Lastpage
298
Keywords
Algebra; Automatic test pattern generation; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Counting circuits; Design for testability; Logic testing; Sequential analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1270851
Filename
1270851
Link To Document