Title :
Race a word-level atpg-based constraints solver system for smart random simulation
Author_Institution :
Synopsys, Inc.
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Arithmetic; Automatic test pattern generation; Automatic testing; Debugging; Design automation; Discrete event simulation; Engines; Hardware; Law; Legal factors;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270852
