Title :
Progressive bridge identification
Author :
Vogels, Thomas J. ; Maly, Wojciech ; Blanton, R.D.
Author_Institution :
Carnegie Mellon University
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Bridge circuits; CMOS logic circuits; Circuit faults; Circuit testing; Dictionaries; Logic circuits; Logic testing; Silicon; System testing; Voltage;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270853
