DocumentCode

403816

Title

Diagnosis-based post-silicon timing validation using statistical tools and methodologies

Author

Krstic, Angela ; Wang, Li.-C. ; Cheng, Kwang-Ting ; Mak, T.M.

Author_Institution

Intel Corporation

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

339

Lastpage

348

Keywords

Circuit simulation; Crosstalk; Delay; Logic; Manufacturing processes; Power system modeling; Predictive models; Silicon; System testing; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1270856

Filename

1270856