Title :
A comprehensive approach to assessing and analyzing 1149.1 test logic
Author :
Melocco, Kevin ; Arora, Hina ; Setlak, Paul ; Kunselman, Gary ; Mardhani, Shazia
Author_Institution :
Cadence Design Systems - Test Design Automation
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Application specific integrated circuits; Automatic testing; Design automation; Design for testability; Logic design; Logic testing; Microelectronics; Registers; System testing; USA Councils;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270858
