Title :
Constructive pattern generation heuristic for meeting sso limits
Author_Institution :
Raytheon Company
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Information analysis; System testing; USA Councils;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270859
