DocumentCode
403819
Title
Constructive pattern generation heuristic for meeting sso limits
Author
Baker, Kendrick
Author_Institution
Raytheon Company
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
368
Lastpage
368
Keywords
Information analysis; System testing; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1270859
Filename
1270859
Link To Document