• DocumentCode
    403820
  • Title

    Optimal interconnect atpg under a ground-flounce constraint

  • Author

    Hollmann, Henk D L ; Marinissen, Erik Jan ; Venneulen, B.

  • Author_Institution
    Philips Research Laboratories
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    369
  • Lastpage
    378
  • Keywords
    Automatic test pattern generation; Automatic testing; Circuit testing; Controllability; Hamming distance; Integrated circuit interconnections; Integrated circuit testing; Laboratories; Observability; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1270860
  • Filename
    1270860
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=403820