DocumentCode :
403821
Title :
Exploiting programmable bist for the diagnosis of embedded memory cores
Author :
Appello, D. ; Bernardi, P. ; Fudoli, A. ; Rebaudengo, M. ; Reorda, M. Sonza ; Tancorre, V. ; Violante, M.
Author_Institution :
Politecnico di Torino
Volume :
1
fYear :
2003
fDate :
Sept. 30-Oct. 2, 2003
Firstpage :
379
Lastpage :
385
Keywords :
Automatic testing; Built-in self-test; Circuit faults; Costs; Design for testability; Fault diagnosis; Logic testing; System-on-a-chip; Technological innovation; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN :
1089-3539
Print_ISBN :
0-7803-8106-8
Type :
conf
DOI :
10.1109/TEST.2003.1270861
Filename :
1270861
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=403821
