DocumentCode
403821
Title
Exploiting programmable bist for the diagnosis of embedded memory cores
Author
Appello, D. ; Bernardi, P. ; Fudoli, A. ; Rebaudengo, M. ; Reorda, M. Sonza ; Tancorre, V. ; Violante, M.
Author_Institution
Politecnico di Torino
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
379
Lastpage
385
Keywords
Automatic testing; Built-in self-test; Circuit faults; Costs; Design for testability; Fault diagnosis; Logic testing; System-on-a-chip; Technological innovation; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1270861
Filename
1270861
Link To Document