Title :
A built-in self-repair scheme for semiconductor memories with 2-d redundancy
Author :
Jin-Fu Li ; Jen-Chieh Yeh ; Rei-Fu Huang ; Cheng-Wen Wu
Author_Institution :
National Central University
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Algorithm design and analysis; Automatic testing; Built-in self-test; Circuit testing; Random access memory; Read-write memory; Redundancy; Semiconductor device manufacture; Semiconductor device testing; System-on-a-chip;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270863
