• DocumentCode
    403823
  • Title

    A built-in self-repair scheme for semiconductor memories with 2-d redundancy

  • Author

    Jin-Fu Li ; Jen-Chieh Yeh ; Rei-Fu Huang ; Cheng-Wen Wu

  • Author_Institution
    National Central University
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    393
  • Lastpage
    402
  • Keywords
    Algorithm design and analysis; Automatic testing; Built-in self-test; Circuit testing; Random access memory; Read-write memory; Redundancy; Semiconductor device manufacture; Semiconductor device testing; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1270863
  • Filename
    1270863
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=403823