DocumentCode
403825
Title
A high precision iddq measurement system with improved dynamic load regulation
Author
Sato, Nobuhiro ; Hashimoto, Yoshihiro
Author_Institution
Advantest Corp.
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
410
Lastpage
414
Keywords
Capacitors; Circuit testing; Current measurement; Current supplies; Integrated circuit measurements; Performance evaluation; Power supplies; Time measurement; Velocity measurement; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1270865
Filename
1270865
Link To Document