Title :
A high precision iddq measurement system with improved dynamic load regulation
Author :
Sato, Nobuhiro ; Hashimoto, Yoshihiro
Author_Institution :
Advantest Corp.
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Capacitors; Circuit testing; Current measurement; Current supplies; Integrated circuit measurements; Performance evaluation; Power supplies; Time measurement; Velocity measurement; Voltage;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270865
