Title :
Extraction error diagnosis and correction in high-performance designs
Author :
Yang, Yu-Shen ; Liu, J. Brandon ; Thadikaran, Paul ; Veneris, Andreas
Author_Institution :
University of Toronto
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Circuit testing; Combinational circuits; Error correction; Libraries; Logic circuits; Logic design; Logic gates; Logic testing; Production; Very large scale integration;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270867
