DocumentCode
403828
Title
Application and analysis of rt-level software-based self-testing for embedded processor cores
Author
Kranitis, N. ; Xenoulis, G. ; Paschalis, A. ; Gizopoulos, D. ; Zorian, Y.
Author_Institution
University of Athens
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
431
Lastpage
440
Keywords
Application software; Automatic testing; Built-in self-test; Energy consumption; Hardware; Logic; Manufacturing processes; Semiconductor device testing; Software testing; System-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1270868
Filename
1270868
Link To Document