Title :
IEEE 1149.6 - a practical perspective
Author :
Eklow, Bill ; Barnhart, Carl ; Ricchetti, Mike ; Borroz, Terry
Author_Institution :
Cisco Systems Inc.
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic testing; Delay; Filters; Hysteresis; Logic design; Logic testing; Signal design; Standards development;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270875
