DocumentCode

403834

Title

Key impediments to dft-focused test and how to overcome them

Author

Posse, Ken ; Eide, Geir

Author_Institution

Teseda Corporation

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

503

Lastpage

511

Keywords

Built-in self-test; Costs; Design for testability; Design methodology; Failure analysis; Frequency; Impedance; System testing; Test equipment; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1270876

Filename

1270876