Title :
Key impediments to dft-focused test and how to overcome them
Author :
Posse, Ken ; Eide, Geir
Author_Institution :
Teseda Corporation
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Built-in self-test; Costs; Design for testability; Design methodology; Failure analysis; Frequency; Impedance; System testing; Test equipment; Voltage;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270876
