DocumentCode

403835

Title

Challenges in low-cost test approach for ARM9^TM core based mixed-signal soc dragonball^TM-MX1

Author

Bao, George

Author_Institution

Motorola Semiconductors Hong Kong Limited

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

512

Lastpage

519

Keywords

Automatic test equipment; Automatic testing; Clocks; Costs; Delta-sigma modulation; Microprocessors; Oscillators; Phase locked loops; Proposals; System-on-a-chip;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1270877

Filename

1270877