Title :
Challenges in low-cost test approach for ARM9TM core based mixed-signal soc dragonballTM-MX1
Author_Institution :
Motorola Semiconductors Hong Kong Limited
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic test equipment; Automatic testing; Clocks; Costs; Delta-sigma modulation; Microprocessors; Oscillators; Phase locked loops; Proposals; System-on-a-chip;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270877
