DocumentCode :
403836
Title :
Ultra low cost linear testing
Author :
Jones, Michael A.
Volume :
1
fYear :
2003
fDate :
Sept. 30-Oct. 2, 2003
Firstpage :
520
Lastpage :
527
Keywords :
Circuit simulation; Circuit testing; Costs; Feedback circuits; Instruments; Manufacturing processes; Operational amplifiers; Packaging; Time measurement; Virtual manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN :
1089-3539
Print_ISBN :
0-7803-8106-8
Type :
conf
DOI :
10.1109/TEST.2003.1270878
Filename :
1270878
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=403836
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