DocumentCode

403837

Title

A generic test path and dut model for datacom ate

Author

Sun, Jie ; Li, Mike

Author_Institution

Wavecrest Corporation

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

528

Lastpage

536

Keywords

Automatic test equipment; Automatic testing; Bandwidth; Electronic equipment testing; Frequency; Intersymbol interference; Jitter; Poles and zeros; System testing; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1270879

Filename

1270879