Title :
A generic test path and dut model for datacom ate
Author :
Sun, Jie ; Li, Mike
Author_Institution :
Wavecrest Corporation
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic test equipment; Automatic testing; Bandwidth; Electronic equipment testing; Frequency; Intersymbol interference; Jitter; Poles and zeros; System testing; Timing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270879
