Mitigating the effects of the dut interface board and test system parasitics in gigabit-plus measurements

Author

Warwick, Thomas P.

Author_Institution

Evaluation and Product Engineering, Inc.

Volume

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

537

Lastpage

544

Keywords

Attenuation; Bonding; Costs; Degradation; Impedance; Jitter; Reflection; System testing; Transmitters; Velocity measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

DOI

10.1109/TEST.2003.1270880

Filename

1270880

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