Title :
Mitigating the effects of the dut interface board and test system parasitics in gigabit-plus measurements
Author :
Warwick, Thomas P.
Author_Institution :
Evaluation and Product Engineering, Inc.
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Attenuation; Bonding; Costs; Degradation; Impedance; Jitter; Reflection; System testing; Transmitters; Velocity measurement;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270880
