Title :
Test vector generation based on correlation model for ratio-IDDQ
Author :
Sun, Xiaoyun ; Kinney, Larry ; Vinnakota, Bapiraju
Author_Institution :
University of Minnesota
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
CMOS technology; Circuit testing; Equations; Fault detection; Frequency; Leakage current; Logic testing; Nearest neighbor searches; Sun; Temperature sensors;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270881
