DocumentCode :
403840
Title :
Hysteresis of intrinsic IDDQ currents
Author :
Okuda, Yukio ; Furukawa, Nobuyuki
Author_Institution :
Platform Technology Center, Sony Corp.
Volume :
1
fYear :
2003
fDate :
Sept. 30-Oct. 2, 2003
Firstpage :
555
Lastpage :
564
Keywords :
Analytical models; Clocks; Condition monitoring; Current measurement; History; Hysteresis; Power measurement; Shape measurement; Testing; Velocity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN :
1089-3539
Print_ISBN :
0-7803-8106-8
Type :
conf
DOI :
10.1109/TEST.2003.1270882
Filename :
1270882
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=403840
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