• DocumentCode
    403840
  • Title

    Hysteresis of intrinsic IDDQ currents

  • Author

    Okuda, Yukio ; Furukawa, Nobuyuki

  • Author_Institution
    Platform Technology Center, Sony Corp.
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    555
  • Lastpage
    564
  • Keywords
    Analytical models; Clocks; Condition monitoring; Current measurement; History; Hysteresis; Power measurement; Shape measurement; Testing; Velocity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1270882
  • Filename
    1270882
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=403840