• DocumentCode
    403841
  • Title

    Screening vdsm outliers using nominal and subthreshold supply voltage IDDQ

  • Author

    Schuermyer, C. ; Benware, B. ; Cota, K. ; Madge, R. ; Daasch, R. ; Ning, L.

  • Author_Institution
    LSI Logic Corporation
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    565
  • Lastpage
    573
  • Keywords
    Application specific integrated circuits; Current measurement; Integrated circuit testing; Large scale integration; Logic design; Logic devices; Logic testing; Nearest neighbor searches; Parameter estimation; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1270883
  • Filename
    1270883
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=403841