DocumentCode :
403841
Title :
Screening vdsm outliers using nominal and subthreshold supply voltage IDDQ
Author :
Schuermyer, C. ; Benware, B. ; Cota, K. ; Madge, R. ; Daasch, R. ; Ning, L.
Author_Institution :
LSI Logic Corporation
Volume :
1
fYear :
2003
fDate :
Sept. 30-Oct. 2, 2003
Firstpage :
565
Lastpage :
573
Keywords :
Application specific integrated circuits; Current measurement; Integrated circuit testing; Large scale integration; Logic design; Logic devices; Logic testing; Nearest neighbor searches; Parameter estimation; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN :
1089-3539
Print_ISBN :
0-7803-8106-8
Type :
conf
DOI :
10.1109/TEST.2003.1270883
Filename :
1270883
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=403841
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