Title :
An efficient algorithm for finding the k longest testable paths through each gate in a combinational circuit
Author :
Qiu, Wangqi ; Walker, D.M.H.
Author_Institution :
Texas A&M University
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Combinational circuits; Computer science; Delay effects; Electrical fault detection; Fault detection; Logic;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270886
