• DocumentCode
    403845
  • Title

    Modeling scan chain modifications for scan-in test power minimization

  • Author

    Sinanoglu, Ozgur ; Orailoglu, Alex

  • Author_Institution
    University of California
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    602
  • Lastpage
    611
  • Keywords
    Algorithm design and analysis; Circuit testing; Computer science; Degradation; Logic gates; Mathematical analysis; Mathematical model; Power engineering and energy; Reliability engineering; Time to market;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1270887
  • Filename
    1270887
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=403845