DocumentCode

403847

Title

On reducing wrapper boundary register cells in modular soc testing

Author

Xu, Qiang ; Nicolici, Nicola

Author_Institution

McMaster University

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

622

Lastpage

631

Keywords

Controllability; Multiplexing; Observability; Registers; Scalability; Semiconductor device manufacture; Semiconductor device testing; Switches; Timing; Wrapping;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1270889

Filename

1270889