Title :
On reducing wrapper boundary register cells in modular soc testing
Author :
Xu, Qiang ; Nicolici, Nicola
Author_Institution :
McMaster University
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Controllability; Multiplexing; Observability; Registers; Scalability; Semiconductor device manufacture; Semiconductor device testing; Switches; Timing; Wrapping;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270889
