Title :
Design and implementation of IEEE 1149.6
Author_Institution :
National Semiconductor
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Circuit faults; Circuit simulation; Circuit synthesis; Circuit testing; Electrical fault detection; Fault detection; Silicon; System testing; USA Councils; Virtual manufacturing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270891
