DocumentCode
403849
Title
Design and implementation of IEEE 1149.6
Author
Duzevik, Ivan
Author_Institution
National Semiconductor
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
640
Lastpage
640
Keywords
Circuit faults; Circuit simulation; Circuit synthesis; Circuit testing; Electrical fault detection; Fault detection; Silicon; System testing; USA Councils; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1270891
Filename
1270891
Link To Document