Title :
Adapting jtag for ac interconnect testing
Author_Institution :
Texas Instruments
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Capacitors; Circuit testing; Instruments; Integrated circuit interconnections; Logic testing; Registers; Resistors; Standards development; Timing; Voltage;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270892
