Title :
Building an rf source for low cost testers using an adpll controlled by texas instruments digital signal processor (DSP) TMS32OC5402
Author :
Sylla, Lboun Taimiya
Author_Institution :
Texas Instruments Inc.
Keywords :
Circuit testing; Costs; Digital signal processing; Digital signal processors; Instruments; Integrated circuit testing; Manufacturing; RF signals; Radio frequency; Signal design;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270894
