Title :
Automatic multitone alternate test-generaton for rf circuits using behavioral models
Author :
Haider, Abrar ; Bhattacharya, Soumendu ; Chatterjee, Abhijit
Author_Institution :
School of ECE, Georgia Institute of Technology
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Costs; Manufacturing; Radio frequency; Semiconductor device testing; System testing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270895
