Title :
Impedance profile of a commercial power grid and test system
Author :
Acharyya, Dhruva ; Plusquelli, Jim
Author_Institution :
University of Maryland
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Circuit testing; Fault detection; Frequency measurement; Impedance; Power grids; Power measurement; Power supplies; Probes; Semiconductor device measurement; System testing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270900
