Title :
Chardin: an off-chip transient current monitor with digital interface for production testing
Author :
Alorda, B. ; Bloechel, B. ; Keshavarzi, A. ; Segura, J.
Author_Institution :
Microprocessor Research Labs, Intel Corporation
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Charge measurement; Circuit testing; Current measurement; Current supplies; Monitoring; Noise measurement; Production; Shape measurement; Transient analysis; Velocity measurement;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270901
