DocumentCode
403859
Title
On reducing aliasing effects and improving diagnosis of logic bist failures
Author
Tekumalla, Ramesh C.
Author_Institution
Sun Microsystems, Inc.
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
737
Lastpage
744
Keywords
Application specific integrated circuits; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Fault diagnosis; Logic; Shift registers; Sun; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1270903
Filename
1270903
Link To Document