DocumentCode
403860
Title
Convolutional compaction of test responses
Author
Rajski, Janusz ; Tyszer, Jerzy ; Wang, Chen ; Reddy, Sudhakar M.
Author_Institution
Poznan University of Technology
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
745
Lastpage
754
Keywords
Built-in self-test; Circuit faults; Circuit testing; Cities and towns; Compaction; Electronics industry; Graphics; Integrated circuit testing; Moore´s Law; Semiconductor device testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1270904
Filename
1270904
Link To Document