Title :
Latch divergency in microprocessor failure analysis
Author :
Dahlgren, Peter ; Dickinson, Paul ; Parulkar, Ishwar
Author_Institution :
Sun Microsystems, Inc.
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic test pattern generation; Built-in self-test; Failure analysis; Intelligent networks; Linear discriminant analysis; Logic testing; Manufacturing; Microprocessors; Noise reduction; Sun;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270905
