403862

Testability features of the alpha 21364 microprocessor

Erlanger, Scott ; Bhavsar, Dilip K. ; Davies, Richard

1

2003

Sept. 30-Oct. 2, 2003

764

772

Automatic testing; Built-in self-test; CMOS technology; Chip scale packaging; Design engineering; Design for testability; Foundries; Microprocessors; Production; Satellites;

English

ieee

Test Conference, 2003. Proceedings. ITC 2003. International

1089-3539

0-7803-8106-8

conf

10.1109/TEST.2003.1270906

1270906