DocumentCode
403862
Title
Testability features of the alpha 21364 microprocessor
Author
Erlanger, Scott ; Bhavsar, Dilip K. ; Davies, Richard
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
764
Lastpage
772
Keywords
Automatic testing; Built-in self-test; CMOS technology; Chip scale packaging; Design engineering; Design for testability; Foundries; Microprocessors; Production; Satellites;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1270906
Filename
1270906
Link To Document