Title :
The testability features of the ARM1026EJ microprocessor core
Author :
McLaurin, Teresa L. ; Frederick, Frank ; Slobodnik, Rich
Author_Institution :
ARM Inc.
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Built-in self-test; Delay; Design for testability; Instruction sets; Linux; Logic; Microprocessors; Operating systems; Testing; Thumb;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270907
