Title :
Tribute board and platform test methodology: intel´s next generation test and validation methodology for platforms
Author_Institution :
Intel Corporation
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Built-in self-test; System testing; USA Councils;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270908
