IBIST^TM (interconnect built-in self-test) architecture and methodology for pci express: intel´s next-generation test and validation methodology for performance IO

Author

Nejedlo, Juy J.

Author_Institution

Intel Corporation

Volume

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

784

Lastpage

784

Keywords

Automatic testing; Built-in self-test; System testing; USA Councils;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

DOI

10.1109/TEST.2003.1270909

Filename

1270909

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