Title :
An extension to jtag for at-speed debug on a system.
Author :
Van de Logt, Leon ; van der Hey´den, F. ; Waayers, Tom
Author_Institution :
Philips Research Eindhoven
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Debugging; Monitoring; Packaging; Pins; Probes; Production; Prototypes; Signal design; Signal resolution; Testing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270910
