Title :
Data criticality estimation in software applications
Author :
Benso, A. ; Di Carlo, S. ; Natale, G. Di ; Prinetto, P. ; Taghaferri, L.
Author_Institution :
Politecnico di Torino
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Application software; Circuit faults; Digital systems; Fault tolerance; Frequency; Hardware; Protection; Redundancy; Single event upset; Software safety;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270912
