DocumentCode
403868
Title
Case study - using stil as test pattern language
Author
Fan, Daniel ; Roehling, Steve ; Carruth, R.
Author_Institution
NPTest, Inc. LLC
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
811
Lastpage
817
Keywords
Automatic test pattern generation; Automatic testing; Computer aided software engineering; Costs; Electronic design automation and methodology; Electronic equipment testing; Failure analysis; Life testing; System testing; Test equipment;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1270913
Filename
1270913
Link To Document