Title :
Case study - using stil as test pattern language
Author :
Fan, Daniel ; Roehling, Steve ; Carruth, R.
Author_Institution :
NPTest, Inc. LLC
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic test pattern generation; Automatic testing; Computer aided software engineering; Costs; Electronic design automation and methodology; Electronic equipment testing; Failure analysis; Life testing; System testing; Test equipment;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270913
